The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2019

Filed:

Jan. 17, 2017
Applicant:

Dolby Laboratories Licensing Corporation, San Francisco, CA (US);

Inventor:

Doh-Suk Kim, Cupertino, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G10L 25/69 (2013.01); G10L 25/60 (2013.01); H04R 29/00 (2006.01); H04M 3/22 (2006.01); H04M 3/56 (2006.01);
U.S. Cl.
CPC ...
G10L 25/69 (2013.01); H04M 3/2236 (2013.01); H04M 3/56 (2013.01); H04R 29/007 (2013.01); G10L 25/60 (2013.01); H04R 2227/009 (2013.01); H04S 2400/15 (2013.01);
Abstract

Systems and methods are described for measuring capture performance of multiple voice signals. A first speech signal is applied to a device, and measured at far-end at a far-end of a testing environment. A second speech signal is separately applied to the device, and is also measured at the far end. The measured speech signals are added, and a quality assessment model is applied to the first far-end combined signal to obtain a first quality metric. The first speech signal and the second speech signal are then both applied at the same time to the device and measured at the far-end. The quality assessment model is applied to the second far-end combined signal to obtain a second quality metric. The quality metric for the second far-end combined signal is normalized, based on the first quality metric, to obtain a performance index for the device.


Find Patent Forward Citations

Loading…