The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2019

Filed:

Mar. 20, 2015
Applicant:

The Regents of the University of California, Oakland, CA (US);

Inventors:

Christopher Jacques Hillar, San Francisco, CA (US);

Laurence Howard Tecott, San Francisco, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G06F 16/28 (2019.01); G06F 16/2457 (2019.01); G06F 16/35 (2019.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 16/24578 (2019.01); G06F 16/287 (2019.01); G06F 16/35 (2019.01); G06F 16/355 (2019.01);
Abstract

Methods for classifying subjects and analyzing the relation between subject classification and multiple features of the subjects are provided. Some embodiments of the disclosure provide processes that use clustering analysis as an unsupervised machine learning technique to classify subjects based on multiple features. Some embodiments may associate features of the subjects with a categorical variable on which subject groups are based. This association between the features and the categorical variable of interest (or subject groups) can be obtained by finding featured-based clusters that have similar members as the subject groups. Systems and computer program products implementing the methods are also disclosed.


Find Patent Forward Citations

Loading…