The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2019

Filed:

Apr. 07, 2014
Applicant:

Colorquick, L.l.c., Pennsauken, NJ (US);

Inventors:

Daniel E. Schultz, Providence, RI (US);

Daniel J. Freiman, Wayne, PA (US);

Mark A. Weiss, Rydal, PA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 7/00 (2006.01); G06F 16/23 (2019.01); G06F 16/25 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01); G06F 16/25 (2019.01);
Abstract

A computer-implemented method is provided of assessing the quality of a database mapping. Fields of a source file are mapped to fields of a target database using a database mapping. A sampled subset of the records in the source file are converted to records in the target database using the field mappings, wherein the quality of the records in the source file is presumed to be high. A data validator is selected from a plurality of different data validators, wherein the selection is made based at least in part on the purpose of the target database. A sampled subset of the converted records are tested with the selected data validator to determine the quality of the database mapping.


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