The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2019
Filed:
Dec. 20, 2013
Generating a visualization of a metric at one or multiple levels of execution of a database workload
Applicant:
Hewlett Packard Enterprise Development Lp, Houston, TX (US);
Inventors:
William K. Wilkinson, San Mateo, CA (US);
Alkiviadis Simitsis, Palo Alto, CA (US);
Craig Peter Sayers, Menlo Park, CA (US);
Assignee:
MICRO FOCUS LLC, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 11/30 (2006.01); G06F 9/50 (2006.01); G06F 17/30 (2006.01); G06F 16/248 (2019.01); G06F 11/32 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3433 (2013.01); G06F 11/323 (2013.01); G06F 16/248 (2019.01); G06F 11/3409 (2013.01); G06F 11/3419 (2013.01);
Abstract
Described herein are techniques for generating a visualization relating to execution of a workload. Multiple measurements of a plurality of metrics relating to execution of the workload may be aggregated at multiple levels of execution. A visualization may be generated that comprises a representation of the measurements of a metric at one of the levels of execution.