The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2019

Filed:

Sep. 28, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Manoj Dusanapudi, Bangalore, IN;

Shakti Kapoor, Austin, TX (US);

Nelson Wu, Austin, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 13/10 (2006.01); G06F 13/28 (2006.01); G06F 12/1081 (2016.01); G06F 11/26 (2006.01); G06F 11/22 (2006.01); G06F 11/263 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3051 (2013.01); G06F 11/2205 (2013.01); G06F 11/26 (2013.01); G06F 11/2635 (2013.01); G06F 12/1081 (2013.01); G06F 13/102 (2013.01); G06F 13/287 (2013.01);
Abstract

A circuit and method provide efficient stress testing of address translations in an integrated circuit such as a link processing unit. A random DMA mode (RDM) circuit provides a random input to index into a translation validation table (TVT) that is used to generate the real memory address. The RDM circuit allows testing all entries of the TVT, and thus all DMA modes, regardless of what bus agents are connected to the link processing unit. The RDM circuit may use a multiplexer to select between a runtime input and a random test input provided by the random bit generator. When the link processing unit is in a test mode a mode selection bit is asserted to select the random test input.


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