The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2019
Filed:
Sep. 19, 2017
Olympus Corporation, Tokyo, JP;
Mitsuru Namiki, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
An apparatus for measuring a scanning pattern of an optical scanning apparatus can easily reduce the effect of stray light and improve the measurement accuracy of the scanning pattern. An apparatus for measuring a scanning pattern of an optical scanning apparatus (), which scans an object being illuminated with illumination light and generates a display image of the object being illuminated, includes a screen () scanned by the illumination light and an optical position detector () that detects the position of an irradiation spot of the illumination light on the screen (). The apparatus for measuring a scanning pattern sequentially detects a position of the irradiation spot at predetermined time points with the optical position detector () during scanning of the screen () to measure the scanning pattern of the illumination light.