The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2019
Filed:
Jun. 21, 2017
Applicant:
Olympus Corporation, Hachioji-shi, Tokyo, JP;
Inventors:
Chika Nakamoto, Tokyo, JP;
Yosuke Tani, Tokyo, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0084 (2013.01); G01B 11/2518 (2013.01); G02B 21/0048 (2013.01);
Abstract
A scanning microscope includes a two-dimensional scanning device that includes a first scanner and a second scanner for scanning, in oscillation motion and with light, a sample in directions orthogonal to each other, the first scanner scanning the sample at a speed higher than a speed of the second scanner, and a scan controller that controls the two-dimensional scanning device.