The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2019

Filed:

Apr. 24, 2018
Applicant:

Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;

Inventors:

Takeshi Shimano, Tokyo, JP;

Yusuke Nakamura, Tokyo, JP;

Kazuyuki Tajima, Tokyo, JP;

Mayu Sao, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/357 (2011.01); H04N 5/40 (2006.01); G02B 3/00 (2006.01); H04N 5/225 (2006.01); H04N 5/217 (2011.01);
U.S. Cl.
CPC ...
G02B 3/0043 (2013.01); H04N 5/217 (2013.01); H04N 5/2254 (2013.01); H04N 5/3572 (2013.01); H04N 5/40 (2013.01);
Abstract

An imaging device includes: an image sensor that outputs, as an image signal, light received at a light-receiving surface; a phase modulation element provided in close to the light-receiving surface, which has a grating pattern composed of multiple zones arranged in a concentric form to modulate the phase of light passing through the grating pattern toward the surface; and an image processing unit that executes image processing for the image signal output from the sensor. The spacing between the phase modulation element and the image sensor is set so that the duty ratio of the full width at half maximum for a bright section to the width for one period of a projection image of the concentric grating pattern is 0.5 or less in the case of light incidence from a point light source disposed at a distance of a subject in the axial direction of a concentric circle of the grating pattern.


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