The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2019
Filed:
Jan. 31, 2017
Halliburton Energy Services, Inc., Houston, TX (US);
Dagang Wu, Katy, TX (US);
Halliburton Energy Services, Inc., Houston, TX (US);
Abstract
An estimated value for invasion depth of an invasion zone in a subsurface measurement zone is calculated in a one-dimensional optimization procedure based on multi-array laterolog measurement data. A one-dimensional optimization problem is defined as having the invasion depth as a sole variable measurement zone parameter. The one-dimensional optimization problem is then solved by automated, iterative modification of the invasion depth value. The one-dimensional optimization problem can be a function to minimize a misfit error between (a) multi-array measurement values for resistivity of the subsurface measurement zone, and (b) predicted measurement values calculated in accordance with a simulated measurement zone model based at least in part on the invasion depth. In one embodiment, the optimization function defines a misfit error between (1) normalized differences between respective measurements of neighboring measurement arrays of the multi-array laterolog tool, and (2) normalized differences between respective predicted measurement values for neighboring measurement arrays.