The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2019

Filed:

Oct. 24, 2018
Applicant:

Korea Institute of Geoscience and Mineral Resources, Daejeon, KR;

Inventors:

Chan Ho Park, Hanam-si, KR;

Won Sik Kim, Daegu, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 15/89 (2006.01); G01V 1/38 (2006.01); G01S 15/88 (2006.01);
U.S. Cl.
CPC ...
G01S 15/89 (2013.01); G01S 15/88 (2013.01); G01V 1/3808 (2013.01); G01V 2210/1427 (2013.01);
Abstract

Provided is method of signal processing of raw data obtained using a chirp sub-bottom profiler. The method includes transmitting a chirplet (minimum frequency: initial first frequency, maximum frequency: initial second frequency, pulse length: initial pulse length) to survey target strata using a chirp sub-bottom profiler and acquiring raw data reflected and received from a target object, correcting the raw data, generating a comparison chirplet using a sub-bottom reflection signal of the raw data, cross-correlating the corrected raw data with the comparison chirplet to generate a first Klauder wavelet section, auto-correlating the comparison chirplet to generate a second Klauder wavelet, and deriving a physical property of the survey target strata by deconvoluting the first Klauder wavelet section and the second Klauder wavelet.


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