The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2019

Filed:

Apr. 15, 2015
Applicants:

Stephan Biber, Erlangen, DE;

Daniel Driemel, Oederan, DE;

Katharina Hesels, Erlangen, DE;

Ralf Ladeback, Erlangen, DE;

Jörg Rothard, Litzendorf, DE;

Inventors:

Stephan Biber, Erlangen, DE;

Daniel Driemel, Oederan, DE;

Katharina Hesels, Erlangen, DE;

Ralf Ladeback, Erlangen, DE;

Jörg Rothard, Litzendorf, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/3875 (2006.01); G01R 33/36 (2006.01); G01V 3/00 (2006.01); G01R 33/34 (2006.01);
U.S. Cl.
CPC ...
G01R 33/3875 (2013.01); G01R 33/34046 (2013.01);
Abstract

A method and a magnetic resonance apparatus compensate for inhomogeneities in a magnetic field generated by the magnetic resonance apparatus with a shim coil of the magnetic resonance apparatus. The shim coil is arranged at an object under investigation. A position and an orientation of the shim coil are automatically determined. The inhomogeneities of the magnetic field are determined. The inhomogeneities are compensated for via the shim coil depending on the position and the orientation of the shim coil.


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