The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2019

Filed:

Jun. 28, 2017
Applicant:

Sichuan Energy Internet Research Institute, Tsinghua University, Chengdu, Sichuan, CN;

Inventors:

Jun Fan, Rolla, MO (US);

Siming Pan, San Jose, CA (US);

Dawei He, Burlingame, CA (US);

Yi Liu, Chengdu, CN;

Jingdong Sun, Rolla, MO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/12 (2006.01); G01R 33/02 (2006.01); G01R 33/10 (2006.01);
U.S. Cl.
CPC ...
G01R 33/12 (2013.01); G01R 33/02 (2013.01); G01R 33/10 (2013.01);
Abstract

A method for evaluating a uniformity of a magnetic field generated by a magnetic coil is disclosed. The method may include providing an electrical current to the magnetic coil to generate a magnetic field; scanning and obtaining a set of signals of the magnetic field by moving a measurement probe of a scanning tool point by point within a scanning region of the magnetic field and at a scanning height; performing a spectrum analysis on the set of signals by a spectrum analyzer to extract spectrum information of the magnetic field; transferring the set of signals and the extracted spectrum information to a computer system; selecting signals of the magnetic field with one or more frequencies from the set of signals based on the extracted spectrum information by the computer system; and analyzing the uniformity of the magnetic field by analyzing the selected signals by the computer system.


Find Patent Forward Citations

Loading…