The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2019

Filed:

May. 30, 2018
Applicant:

Primax Electronics Ltd., Taipei, TW;

Inventors:

Cheng-Yi Tsai, Taipei, TW;

Ying-Che Tseng, Taipei, TW;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/073 (2006.01); G01R 1/067 (2006.01); G01L 1/22 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2808 (2013.01); G01R 1/06722 (2013.01); G01R 1/07328 (2013.01); G01L 1/22 (2013.01);
Abstract

A circuit test system is provided for testing a circuit of a circuit board. The circuit test system includes a test platform, a pressing plate and a computing device. The test platform includes plural contact elements. Each contact element includes a strain gauge and a pogo pin. During the process of testing the circuit board, a test program of the computing device monitors and reads a pressure value, a downward displacement and an impedance value of the contact element. Moreover, the test program judges whether the function of the contact element is normal according to the pressure value, the downward displacement and the impedance value.


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