The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2019
Filed:
Jul. 27, 2018
Applicant:
Anton Paar Gmbh, Graz, AT;
Inventors:
Martin Godec-Schönbacher, Graz, AT;
Alberto Gomez-Casado, Seiersberg-Pirka, AT;
Daniel Koller, Graz, AT;
Markus Brandner, Raaba-Grambach, AT;
Assignee:
Anton Paar GmbH, Graz, AT;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 20/02 (2010.01); G01Q 30/02 (2010.01); G01Q 10/06 (2010.01); G01Q 30/04 (2010.01); G01Q 60/38 (2010.01);
U.S. Cl.
CPC ...
G01Q 20/02 (2013.01); G01Q 10/06 (2013.01); G01Q 30/02 (2013.01); G01Q 30/025 (2013.01); G01Q 30/04 (2013.01); G01Q 60/38 (2013.01);
Abstract
A scanning probe microscope, in particular an atomic force microscope, for analyzing a sample by moving a probe and the sample relative to one another, wherein the scanning probe microscope includes a detection unit with a side view camera arranged and configured for detecting an image of the sample in a substantially horizontal side view, and a determining unit for determining information indicative of a profile of at least part of a surface of the sample based on the detected image.