The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2019

Filed:

Sep. 19, 2017
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Tsukasa Eguchi, Matsumoto, JP;

Hideto Ishiguro, Shiojiri, JP;

Hikaru Kurasawa, Shiojiri, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/27 (2006.01); G01N 21/359 (2014.01);
U.S. Cl.
CPC ...
G01N 21/274 (2013.01); G01N 21/359 (2013.01); G01N 2201/12746 (2013.01);
Abstract

A calibration data acquisition unit uses an equation X=YW in which an optical spectrum matrix X is the same as a product between a component natural spectrum matrix Y and a component amount matrix X, performs independent component analysis in which column vectors of the component amount matrix W are treated as independent components so as to determine the component natural spectrum matrix Y, and employs row vectors of a general inverse matrix Yof the component natural spectrum matrix Y as component calibration spectra corresponding to a plurality of components. A calibration curve is created by using a target component calibration spectrum corresponding to a target component.


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