The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2019

Filed:

Dec. 12, 2016
Applicant:

Mitsubishi Heavy Industries, Ltd., Tokyo, JP;

Inventors:

Hideyuki Sakata, Tokyo, JP;

Hiroyuki Kojima, Tokyo, JP;

Hiroshi Matsuoka, Tokyo, JP;

Yuji Momose, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/08 (2006.01); G21C 15/18 (2006.01); G21C 17/022 (2006.01); G21C 19/307 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0806 (2013.01); G21C 15/182 (2013.01); G21C 17/022 (2013.01); G21C 19/307 (2013.01); G01N 2015/084 (2013.01); Y02E 30/40 (2013.01);
Abstract

Acquiring sets of test data on amounts of foreign matter passed through a recirculation sump screen when different amounts of foreign matter are input; forming a passed foreign matter amount approximate line that approximates the amounts of passed foreign matter with respect to the amounts of input foreign matter on the basis of the sets of test data on the amounts of passed foreign matter; forming a passed foreign matter amount envelope tangent to the passed foreign matter amount approximate line; and estimating a total passed foreign matter amount with respect to the amounts of input foreign matter on the basis of the passed foreign matter amount envelope to evaluate the recirculation sump screen are provided.


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