The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2019

Filed:

Sep. 08, 2015
Applicant:

Ams Sensors Singapore Pte. Ltd., Singapore, SG;

Inventors:

Peter Roentgen, Thalwil, CH;

Jens Geiger, Thalwil, CH;

Markus Rossi, Jona, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 9/00 (2006.01); G01J 1/42 (2006.01); G01J 3/28 (2006.01); H01L 27/144 (2006.01); H01L 31/0232 (2014.01); H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
G01J 9/00 (2013.01); G01J 1/4257 (2013.01); G01J 3/2803 (2013.01); H01L 27/1443 (2013.01); H01L 27/1446 (2013.01); H01L 31/02327 (2013.01); H01L 27/14621 (2013.01); H01L 27/14647 (2013.01);
Abstract

The present disclosure describes optical radiation sensors and detection techniques that facilitate assigning a specific wavelength to a measured photocurrent. The techniques can be used to determine the spectral emission characteristics of a radiation source. In one aspect, a method of determining spectral emission characteristics of incident radiation includes sensing at least some of the incident radiation using a light detector having first and second photosensitive regions whose optical responsivity characteristics differ from one another. The method further includes identifying a wavelength of the incident radiation based on a ratio of a photocurrent from the first region and a photocurrent from the second region.


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