The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2019
Filed:
Feb. 24, 2016
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventor:
Marcus Dyba, Heidelberg, DE;
Assignee:
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/44 (2006.01); G01J 1/42 (2006.01); G02B 21/00 (2006.01); G01J 3/02 (2006.01); G01J 3/28 (2006.01); H01L 31/107 (2006.01);
U.S. Cl.
CPC ...
G01J 1/44 (2013.01); G01J 1/42 (2013.01); G01J 3/0297 (2013.01); G01J 3/2803 (2013.01); G02B 21/008 (2013.01); H01L 31/107 (2013.01); G01J 2001/442 (2013.01); G01J 2001/444 (2013.01); G01J 2001/4406 (2013.01); G01J 2001/4466 (2013.01);
Abstract
A method for improving dynamic range of a device for detecting light includes providing at least two detection regions. The detection regions are each formed by an array of a plurality of single-photon avalanche diodes (SPADs) and the detection regions each comprise at least one signal output. A characteristic curve is determined for each of the detection regions. The characteristic curves are combined with one another and/or offset against one another in order to obtain a correction curve and/or a correction factor.