The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2019

Filed:

Nov. 29, 2018
Applicant:

Ramot AT Tel-aviv University Ltd., Tel Aviv, IL;

Inventors:

Natan Tzvi Shaked, Mazkeret Batya, IL;

Nir Turko, Tel Aviv, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02047 (2013.01); G01B 9/02007 (2013.01); G01B 11/2441 (2013.01);
Abstract

The present invention relates to a new interferometric module which may be implemented as holographic/interferometric portable optical setups that are based on the interferometry with multiple wavelengths acquired simultaneously, without changing the imaging parameters, such as the magnification and the resolution, and recording the quantitative complex wave front (i.e. amplitude and phase) imaging in several wavelengths simultaneously. This may be used for multiple-wavelength phase unwrapping, for recording higher or optically thicker samples or for spectroscopic holography, without loss of camera frame rate due to wavelength scanning.


Find Patent Forward Citations

Shaked, Natan. (2019). Multi wavelength multiplexing for quantitative interferometry (U.S. Patent No. 10488175). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10488175

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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