The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2019
Filed:
Sep. 11, 2017
Applicant:
Amo Wavefront Sciences, Llc, Santa Ana, CA (US);
Inventors:
Richard J. Copland, Albuquerque, NM (US);
David J. Tanzer, San Diego, CA (US);
Thomas D. Raymond, Edgewood, NM (US);
Assignee:
AMO WaveFront Sciences, LLC, Santa Clara, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); A61B 3/103 (2006.01); A61B 3/11 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0091 (2013.01); A61B 3/0025 (2013.01); A61B 3/0075 (2013.01); A61B 3/103 (2013.01); A61B 3/1035 (2013.01); A61B 3/112 (2013.01);
Abstract
A system and method for measuring a characteristic of an eye of a subject receive data pertaining to the subject; assign the subject to an assigned age category based on the data pertaining to the subject; adjust a brightness level of a fixation target according to the assigned age category for the subject; provide the fixation target for a subject to view; and objectively measure at least one characteristic of the eye of the subject while the subject views the fixation target at the adjusted brightness level.