The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Oct. 31, 2017
Applicants:
Sony Corporation, Tokyo, JP;
Sony Interactive Entertainment Inc., Tokyo, JP;
Inventors:
Peter Shintani, San Diego, CA (US);
Morio Usami, Tokyo, JP;
Kazuyuki Shikama, Tokyo, JP;
Keith Resch, San Diego, CA (US);
Assignees:
SONY CORPORATION, Tokyo, JP;
Sony Interactive Entertainment Inc., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/271 (2018.01); G01S 17/89 (2006.01); G06T 7/55 (2017.01); G06T 15/20 (2011.01); G06F 3/01 (2006.01); G06F 3/0488 (2013.01); H04N 13/128 (2018.01); H04N 13/25 (2018.01); G06T 5/50 (2006.01); G06T 7/593 (2017.01);
U.S. Cl.
CPC ...
H04N 13/271 (2018.05); G01S 17/89 (2013.01); G06F 3/017 (2013.01); G06F 3/04883 (2013.01); G06T 5/50 (2013.01); G06T 7/55 (2017.01); G06T 7/593 (2017.01); G06T 15/205 (2013.01); H04N 13/128 (2018.05); H04N 13/25 (2018.05); G06T 2207/10028 (2013.01);
Abstract
Parallax views of objects are used to generate 3D depth maps of the objects using time of flight (TOF) information. In this way, the deleterious effects of multipath interference can be reduced to improve 3D depth map accuracy without using computationally intensive algorithms.