The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Feb. 16, 2017
Applicant:

Symantec Corporation, Mountain View, CA (US);

Inventor:

Ryan Curtin, Atlanta, GA (US);

Assignee:

Symantec Corporation, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 17/11 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
H04L 63/1408 (2013.01); G06F 17/11 (2013.01); G06N 20/00 (2019.01);
Abstract

The disclosed computer-implemented method for detecting low-density training regions of machine-learning classification systems may include (i) receiving a training dataset that is used to train a classifier of a machine-learning classification system, (ii) calculating a density estimate of a distribution of the training dataset, (iii) receiving a sample that is to be classified by the classifier, (iv) using the density estimate to determine that the sample falls within a low-density region of the distribution of the training dataset, and (v) performing a security action in response to determining that the sample falls within the low-density region. Various other methods, systems, and computer-readable media are also disclosed.


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