The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Feb. 23, 2018
Wistron Neweb Corporation, Hsinchu, TW;
Chia-Hsiang Wang, Hsinchu, TW;
Horen Chen, Hsinchu, TW;
WISTRON NEWEB CORPORATION, Hsinchu, TW;
Abstract
A structure detection system and method for detecting anomalies associated with the structure are provided. The system includes a first transceiver, a second transceiver, and a processor. In a first TR test, the second transceiver receives a first probing signal sent from the first transceiver and performs a time-reversal (TR) process to generate a first TR signal to be sent to the first transceiver, and a first channel state information (CSI) is obtained in response to the first TR signal. In a second TR test, the first transceiver receives a second probing signal sent from the second transceiver and performs the TR process to generate a second TR signal to be sent to the second transceiver, a second CSI is obtained in response to the second TR signal. The processor compares a combination of the first CSI and the second CSI to a reference CSI for detecting anomalies.