The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Feb. 21, 2019
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Aravind Ganesan, Bengaluru, IN;

Jaiganesh Balakrishnan, Bengaluru, IN;

Sashidharan Venkatraman, Bengaluru, IN;

Bragadeesh Suresh Babu, Chennai, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/12 (2006.01); H03M 1/06 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1215 (2013.01); H03M 1/06 (2013.01); H03M 1/1255 (2013.01);
Abstract

A method for frequency domain to time domain conversion includes receiving a set of frequency-domain samples. Based on the set of frequency-domain samples, a first sample subset comprising a predetermined fraction of the number of samples of the set of frequency-domain samples and a second sample subset comprising the predetermined fraction of the number of samples of the set of frequency-domain samples are generated. A linear phase rotation is applied to the first sample subset and the second sample subset to produce a phase rotated first sample subset and a phase rotated second sample subset. The phase rotated first sample set is post-processed to generate a first set of time-domain samples. The phase rotated second sample set is post-processed to generate a second set of time-domain samples. The first set of time-domain samples and the second set of time-domain samples are reordered to produce an output set of time-domain samples.


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