The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Oct. 11, 2017
Applicant:

Harxon Corporation, Shenzhen, Guangdong, CN;

Inventors:

Wenping Wu, Guangdong, CN;

Xiaohui Wang, Guangdong, CN;

Shiwei Wu, Guangdong, CN;

Jie Zhang, Guangdong, CN;

Assignee:

Harxon Corporation, Shenzhen, Guangdong, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 1/52 (2006.01); H01Q 1/38 (2006.01); H01Q 1/50 (2006.01); H01Q 1/22 (2006.01); H01Q 9/04 (2006.01); H01Q 21/28 (2006.01); H01Q 25/00 (2006.01);
U.S. Cl.
CPC ...
H01Q 1/38 (2013.01); H01Q 1/2291 (2013.01); H01Q 1/50 (2013.01); H01Q 1/52 (2013.01); H01Q 9/0414 (2013.01); H01Q 21/28 (2013.01); H01Q 25/00 (2013.01);
Abstract

A multifunctional GNSS antenna includes a PCB and first and second dielectric plates arranged in a stacked manner. The PCB has a lower surface with a circuit network, which is covered by a metal shield cover. The first dielectric plate has an upper surface with a first metal layer and a lower surface attached to an upper surface of the PCB. A first feed probe penetrates the first metal layer and the first dielectric plate and is coupled with the circuit network. A third metal layer is embedded in an edge and a lateral surface of the first dielectric plate, and is coupled by a third feed probe with the circuit network while a first short-circuit probe shorts the third metal layer to ground. The second dielectric plate has an upper surface with a second metal layer coupled by a second feed probe with the circuit network.


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