The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Jun. 27, 2018
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventors:

Yoshiyuki Kawashima, Tokyo, JP;

Atsushi Yoshitomi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/11573 (2017.01); H01L 27/11568 (2017.01); H01L 21/28 (2006.01); H01L 29/423 (2006.01);
U.S. Cl.
CPC ...
H01L 27/11573 (2013.01); H01L 21/28282 (2013.01); H01L 27/11568 (2013.01); H01L 29/4234 (2013.01);
Abstract

To provide a semiconductor device capable of having an ONO-film-configuring second oxide film with an optimized thickness. The semiconductor device has a semiconductor substrate having a first surface, a first gate insulating film placed on the first surface located in a first transistor formation region, and a second gate insulating film placed on the first surface located in a second transistor formation region. The first gate insulating film has a first oxide film, a first nitride film placed thereon, and a second oxide film placed thereon. The second oxide film includes a first layer and a second layer placed thereon. The height of the first surface in a region where the second insulating film is placed is lower than that in a region where the first gate insulating film is placed. The nitrogen concentration in the first layer is higher than that in the second layer.


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