The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Sep. 13, 2017
Applicant:

Stmicroelectronics S.r.l., Agrate Brianza, IT;

Inventors:

Giona Fucili, Milan, IT;

Agostino Mirabelli, Lornello, IT;

Lorenzo Papillo, Milan, IT;

Assignee:

STMicroelectronics S.r.l., Agrate Brianza, IT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); H01L 23/544 (2006.01); H01L 23/525 (2006.01); H01L 21/67 (2006.01); H01L 21/78 (2006.01); G01R 31/317 (2006.01); G11C 17/16 (2006.01);
U.S. Cl.
CPC ...
H01L 23/544 (2013.01); G01R 31/31718 (2013.01); H01L 21/67271 (2013.01); H01L 21/78 (2013.01); H01L 22/14 (2013.01); H01L 22/34 (2013.01); H01L 23/5256 (2013.01); G11C 17/16 (2013.01); G11C 17/165 (2013.01); H01L 21/67294 (2013.01); H01L 2223/5448 (2013.01); H01L 2223/54413 (2013.01); H01L 2223/54433 (2013.01); H01L 2223/54473 (2013.01);
Abstract

Many integrated circuit die are fabricated on a wafer. Each die includes integrated functional circuitry with an array of fuse elements that are visible to optical inspection. An electrical wafer sort is performed to test the integrated functional circuitry of each die. The array of fuse elements for each die on the wafer are programmed through the electrical wafer sort process with data bits defining a die identification that specifies a location of the die on the wafer. The die is then encapsulated in a package. In the event of package failure, a decapsulation is performed to access the die. Optical inspection of the array of fuse elements is then made to extract the die identification.


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