The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Jul. 30, 2018
Applicant:

Shenzhen Epostar Electronics Limited Co., Shenzhen, CN;

Inventors:

Yu-Hua Hsiao, Hsinchu County, TW;

Li-Hsun Liu, Taoyuan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/26 (2006.01); G11C 11/56 (2006.01); G11C 11/408 (2006.01); G11C 16/08 (2006.01); G11C 16/04 (2006.01);
U.S. Cl.
CPC ...
G11C 16/26 (2013.01); G11C 11/4087 (2013.01); G11C 11/5642 (2013.01); G11C 16/08 (2013.01); G11C 16/0483 (2013.01);
Abstract

A decoding method is provided. The method includes selecting a target word line among a plurality of word lines; respectively reading a plurality of target memory cells of the target word-line by using different X read voltage sets to obtain corresponding X Gray code summation sets; calculating a Gray code count summation difference of the Gray code count summations at the same sequence position respectively in N−1 Gray code count summations between every pair of adjacent Gray code summation sets of the X Gray code summation sets, so as to obtain X−1 Gray code count summation difference sets corresponding to all pairs of the Gray code summation sets; and deciding N−1 optimized read voltages from X*(N−1) read voltages belonging to the X read voltage sets according to the X−1 Gray code count summation difference sets.


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