The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Sep. 22, 2017
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Gi Yeong Kim, Gyeonggi-do, KR;

Kyoung Young Kim, Gyeonggi-do, KR;

Young Chan Jeon, Gyeonggi-do, KR;

Jeong Won Lee, Gyeonggi-do, KR;

Hee Chul Han, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/239 (2018.01); G06T 7/80 (2017.01); H04N 13/246 (2018.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
G06T 7/85 (2017.01); H04N 5/23287 (2013.01); H04N 13/239 (2018.05); H04N 13/246 (2018.05); G06T 2207/10012 (2013.01);
Abstract

An electronic device includes a first camera that obtains a first image, a second camera that obtains a second image having a disparity with the first image, a memory that stores a first calibration parameter, and a processor that calibrates at least one of the first image and the second image by using the first calibration parameter and composes the first image and the second image. The processor is configured to collect, if a specified event occurs, images obtained from the first camera and the second camera after the specified event occurs and store the collected images in the memory, to compute a second to calibration parameter based on the images obtained after the specified event occurs, if a specified condition is satisfied, and to update the first calibration parameter with the second calibration parameter.


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