The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Jan. 08, 2018
Mediatek Inc., Hsin-Chu, TW;
Yu-Lin Chang, Taipei, TW;
Yu-Pao Tsai, Kaohsiung, TW;
MEDIATEK INC., Hsin-Chu, TW;
Abstract
Calibration methods for calibrating image capture devices of an around view monitoring (AVM) system mounted on vehicle are provided, the calibration method including: extracting local patterns from images captured by each image capture device, wherein each local pattern is respectively disposed at a position within the image capturing range of one of the image capture devices; acquiring an overhead-view (OHV) image from OHV point above vehicle, wherein the OHV image includes first patterns relative to the local patterns for the image capture devices; generating global patterns from the OHV image using the first patterns, each global pattern corresponding to one of the local patterns; matching the local patterns with the corresponding global patterns to determine camera parameters and transformation information corresponding thereto for each image capture device; and calibrating each image capture device using determined camera parameters and transformation information corresponding thereto so as to generate AVM image.