The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Aug. 27, 2015
S.d. Sight Diagnostics Ltd, Tel Aviv, IL;
S.D. Sight Diagnostics Ltd., Jerusalem, IL;
Abstract
A digital microscopy method, comprising: obtaining data representative of a series of images of at least a portion of a cell sample, the images being captured by performing a depth scan using a digital microscope, the series of images being associated with a series of depth levels of the cell sample, wherein the portion encompasses a mapping field, and the mapping field comprises a plurality of focus analysis regions; and calculating, using the images, a focus configuration for at least two of the focus analysis regions within the mapping field, giving rise to data indicative of focus variations within the mapping field.
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