The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Feb. 05, 2016
Nec Corporation, Minato-ku, Tokyo, JP;
Masato Ishii, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
Provided are a feature transformation device and others enabling feature transformation with high precision. The feature transformation device includes receiving means for receiving training data and test data each including a plurality of samples, optimization means for optimizing weight and feature transformation parameter based on an objective function related to the weight and the feature transformation parameter, the optimization means including weight derivation means for deriving the weight assigned to each element included in the training data and feature transformation parameter derivation means for deriving the feature transformation parameter that transforms each of the samples included in the training data or the test data, objective function derivation means for deriving a value of the objective function, the objective function derivation means including a constraint determination means for determining whether the weight satisfies a prescribed constraint and regularization means for regularizing at least one of the weight or the feature transformation parameter, and transformation means for transforming an element included in at least one of the training data or the test data based on the feature transformation parameter.