The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Jun. 30, 2017
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Conal McGarvey, Seattle, WA (US);

Jakob F. Lichtenberg, Redmond, WA (US);

Andrew D. Mikesell, Kirkland, WA (US);

Remy L. De Weduwe, Seattle, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/263 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0721 (2013.01); G06F 11/263 (2013.01);
Abstract

Systems and methods to conduct data-driven, system wide tests are disclosed. Instructions for testing an operating system are associated with one or more modules associated with the computing system. When a failed test is identified, a second set of instructions that accounts for the failed test is generated and executed, in order to efficiently identify and target specific issues. Results from these fully configurable testing methods can be communicated and utilized in further applications.


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