The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Feb. 16, 2016
Microvision, Inc., Redmond, WA (US);
P. Selvan Viswanathan, Bellevue, WA (US);
Roeland Collet, Olympia, WA (US);
George Thomas Valliath, Winnetka, IL (US);
Jari Honkanen, Monroe, WA (US);
Matthieu Saracco, Redmond, WA (US);
Microvision, Inc., Redmond, WA (US);
Abstract
Briefly, in accordance with one or more embodiments, an information handling system comprises a scanning system to scan one or more component wavelength beams into a combined multi-component beam in a first field of view, and a redirecting system to redirect one or more of the component wavelength beams into a second field of view. A first subset of the one or more component wavelength beams is projected in the first field of view and a second subset of the one or more component wavelength beams is projected in the second field of view. The first subset may project a visible image in the first field of view, and user is capable of providing an input to control the information handling system via interaction with the second subset in the second field of view.