The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Dec. 08, 2015
Applicant:

GE Healthcare Bio-sciences Corp., Piscataway, NJ (US);

Inventor:

Jeremy R. Cooper, Issaquah, WA (US);

Assignee:

GE Healthcare Bio-Sciences Corp., Piscataway, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/02 (2006.01); G02B 21/16 (2006.01); G02B 21/18 (2006.01); G02B 21/08 (2006.01); G02B 21/00 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/086 (2013.01); G02B 21/0088 (2013.01); G02B 21/02 (2013.01); G02B 21/367 (2013.01); G02B 21/16 (2013.01); G02B 21/18 (2013.01);
Abstract

Disclosed is an optical arrangement providing selective plane illumination, including an inverted illumination objective mounted below a sample support in use providing a line or plane of light at the sample support, and at least one image collection objective mounted above the support, said inverted illumination objective having an illumination objective optic axis, and said image collection objective having an image collection objective optical axis, wherein illumination light is arranged to propagate toward the illumination objective lateral offset to the illumination objective optical axis such that the illumination light leaving the illumination objective propagates toward the sample support at an oblique angle relative to the illumination objective optical axis, and wherein the image objective optical axis has an angle α which is obtuse to the illumination objective optical axis and generally perpendicular to light propagating at the sample support.


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