The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Feb. 07, 2017
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Embl European Molecular Biology Laboratory, Heidelberg, DE;
Frank Sieckmann, Bochum, DE;
Urban Liebel, Dielheim-Horrenberg, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
EMBL EUROPEAN MOLECULAR BIOLOGY LABORATORY, Heidelberg, DE;
Abstract
A method for scanning a sample using an electrically or electronically controllable microscope includes performing a continuous scanning of the sample so as to repeatedly generate a plurality of images of the sample, each of the plurality of images corresponding to a different time, the microscope being controlled via a control computer during the scanning. The plurality of images are analyzed using at least one second computer connected via a network, wherein the at least one second computer is configured to classify each of the plurality of images as one of interesting and non-interesting while the continuous scanning of the sample with the microscope continues. The continuous scanning of the sample is automatically influenced based on the classifying of the images performed by the at least one second computer.