The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Oct. 04, 2018
Tammy Kee-wai Lee, Toronto, CA;
William LA, Toronto, CA;
Paul Quevedo, Toronto, CA;
Aryeh Benjamin Taub, Toronto, CA;
Yusuf Bismilla, Toronto, CA;
Sam Anthony Leitch, Toronto, CA;
Yuri Alexander Kuzyk, Toronto, CA;
Ze Shan Yao, Toronto, CA;
Michael Frank Gunter Wood, Toronto, CA;
Tammy Kee-Wai Lee, Toronto, CA;
William La, Toronto, CA;
Paul Quevedo, Toronto, CA;
Aryeh Benjamin Taub, Toronto, CA;
Yusuf Bismilla, Toronto, CA;
Sam Anthony Leitch, Toronto, CA;
Yuri Alexander Kuzyk, Toronto, CA;
Ze Shan Yao, Toronto, CA;
Michael Frank Gunter Wood, Toronto, CA;
SYNAPTIVE MEDICAL (BARBADOS) INC., Bridgetown, BB;
Abstract
Methods and systems for controlling a surgical microscope. Moveable optics of the surgical microscope are controlled using two sets of control parameters, to reduce jitter and image instability. Shifts in the image due to changes in temperature or due to the use of optical filter can also be compensated. Misalignment between the mechanical axis and the optical axis of the surgical microscope can also be corrected.