The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
May. 03, 2016
Texas Instruments Incorporated, Dallas, TX (US);
Muhammad Zubair Ikram, Richardson, TX (US);
Murtaza Ali, Plano, TX (US);
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
This invention is present an iterative method for joint antenna array calibration and direction of arrival estimation using millimeter-wave (mm-Wave) radar. The calibration compensates for array coupling, phase, and gain errors and does not require any training data. This method is well suited for applications where multiple antenna elements are packaged in a chip and where offline calibration is either expensive or is not possible. This invention is also effective when the array coupling is a function of direction of arriving waves from the object. It is also applicable to any two-dimensional array shape. Real experiment results demonstrate the viability of the algorithm using real data collected from a four-element array.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile