The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Feb. 15, 2018
Applicant:

Allegro Microsystems, Llc, Manchester, NH (US);

Inventors:

Hernán D. Romero, Buenos Aires, AR;

Octavio H. Alpago, Buenos Aires, AR;

Assignee:

Allegro MicroSystems, LLC, Manchester, NH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/07 (2006.01); H03F 3/45 (2006.01); H03F 1/26 (2006.01); H01L 43/04 (2006.01); H03F 3/387 (2006.01); H03M 1/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/075 (2013.01); H01L 43/04 (2013.01); H03F 1/26 (2013.01); H03F 3/387 (2013.01); H03F 3/45475 (2013.01); H03F 3/45977 (2013.01); H03M 1/00 (2013.01); H03F 2200/331 (2013.01); H03F 2200/408 (2013.01); H03F 2203/45528 (2013.01);
Abstract

A sensor circuit may include one or more feedback loops to process and attenuate ripple and/or a test signal. The sensor circuit may comprise at least one magnetic field sensing element to generate a magnetic field signal representing a magnetic field to be measured, a test signal generator circuit configured to generate a test signal and combine the test signal with the magnetic field signal to generate a combined signal, and a signal path for processing the combined signal. The signal path may comprise an amplifier circuit to amplify the combined signal, an analog-to-digital converter (ADC) to convert the combined signal to a digital combined signal, and a feedback circuitry coupled to receive the digital combined signal and extract the test signal. A test comparator circuit compares the extracted test signal to a reference signal.


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