The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Sep. 08, 2016
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Ramana Tadepalli, McKinney, TX (US);

Robert Gabriel Almendarez, Carrollton, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/00 (2006.01); G01R 31/319 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31908 (2013.01); G01R 31/3191 (2013.01); G01R 31/31919 (2013.01);
Abstract

A system that can include a computing device, upon implementing a host test program, can be configured to generate compiled host test instructions based on a non-host test program code that has been prepared in accordance with performance characteristics of a non-host automatic test equipment (ATE) and based on calibration data and/or offset data associated with a host ATE. The system can further include a hardware adapter that can be configured to generate non-host test signals based on host test signals generated by a host ATE and with substantially similar characteristics as test signals generated by the non-host ATE, wherein the host test signals are generated by the host ATE based on the compiled host test instructions.


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