The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Dec. 07, 2017
Qualcomm Incorporated, San Diego, CA (US);
Arvind Jain, Bangalore, IN;
Nishi Bhushan Singh, Bangalore, IN;
Rahul Gulati, San Diego, CA (US);
Pranjal Bhuyan, San Diego, CA (US);
Rakesh Kumar Kinger, San Diego, CA (US);
Roberto Averbuj, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
A self-test controller includes a memory configured to store a test patterns, configuration registers, and a memory data component. The test patterns are encoded in the memory using various techniques in order to save storage space. By using the configuration parameters, the memory data component is configured to decode the test patterns and perform multiple built-in self-test on a multitude of test cores. The described techniques allow for built-in self-test to be performed dynamically while utilizing less space in the memory.