The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Jan. 18, 2018
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

David Wayne Kaase, Grapevine, TX (US);

Joseph Milton Yehle, Dallas, TX (US);

James Henry McGee, Jr., Rowlett, TX (US);

Clemon Howell, Allen, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/12 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2817 (2013.01); G01R 31/129 (2013.01); G01R 31/1281 (2013.01); G01R 31/2856 (2013.01); G01R 31/2863 (2013.01);
Abstract

A system and method for stress-testing of electronic components are disclosed. The system and method include a stationary bath including a tub that defines an aperture in a plane, in which a plurality of slots are positionable and defined inside the tub and oriented orthogonally with respect to the plane. A dielectric fluid in the tub is heated by a heating element to a predetermined temperature value. A board is configured to be retrievably placed with one of the plurality of slots, the board having a plurality of sockets operable to receive corresponding electronic components.


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