The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Feb. 12, 2014
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Kenichi Mishima, Kameoka, JP;
Etsuho Kamata, Kameoka, JP;
Hiroshi Miura, Kyoto, JP;
Yasuhiro Mito, Kyotanabe, JP;
Toshinobu Yanagisawa, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;
Abstract
Regarding a chromatogram data processing device configured to process three-dimensional chromatogram data collected on a target sample in which dimensions are made up of time, wavelength, and absorbance, and the chromatogram data processing device includes a differential spectrum generating means configured to generate a differential spectrum that represents a change in a wavelength differential coefficient, which is a differential coefficient in a wavelength direction in a predetermined wavelength range, based on the three-dimensional chromatogram data, with respect to an absorbance spectrum representing a relation of the wavelength and the absorbance at each time in an entire temporal range or a predetermined temporal range, and a determination means configured to determine whether or not one or plural other components are included in a peak of a target component, based on a temporal change in a waveform of the differential spectrum, so that the determination on whether or not a target sample includes impurities can be performed with high accuracy without the requirement of complicated computation processing.