The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Aug. 07, 2015
Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
John R. Franzini, Hollis, NH (US);
Mark B. Lyles, Exeter, RI (US);
Robert H. Murphy, Lancaster, MA (US);
BAE Systems Information and Electronic Systems Integratlon Inc., Nashua, NH (US);
Other;
Abstract
A nondestructive system and method for high resolution thermal imaging in metal casting applications is provided to detect defects and starts with the article under test being subjected to a thermal gradient, followed by infrared images taken thereof. The creation of the thermal gradient results in any defects reacting differently to the thermal gradient application to accentuate the defect in the infrared image. The apparatus for conducting the tests in one embodiment includes a single channel sensor, remote cable, and a laptop controller with real time image processing software. This hardware provides high resolution, real-time viewable infrared (IR) images with a variable focus distance adjustable from six inches to infinity. The apparatus enables crisp, clear imagery of various metal casting defects.