The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Feb. 06, 2016
Eyesense Gmbh, Grossostheim, DE;
Ralf Mueller, Mittweida, DE;
Hans-Georg Ortlepp, Apfelstaedt, DE;
EYESENSE GMBH, Grossosthe Im, DE;
Abstract
An arrangement for examining a sample which can be excited by means of electromagnetic radiation comprises a first dichroitic beam splitter having a first and a second prism, which are connected to one another on the base surfaces thereof, and a dichroitic layer arranged between the base surfaces of the two prisms, wherein an entry surface of the first prism encloses an angle (β) in the range from 10° to <40° with the dichroitic layer. Furthermore a light source provides the electromagnetic radiation suitable for excitation of the sample, the radiation coupled into the entry surface of the first prism, wherein a part of the radiation is reflected on the dichroitic layer in the direction of the sample, which is positioned downstream of an exit surface of the first prism. Finally, a detector detects electromagnetic radiation emitted by the sample, passed through the beam splitter and leaving the latter on a measurement surface. The invention further relates to a dichroitic beam splitter, for use in said arrangement.