The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Jul. 03, 2018
Applicant:

Yokogawa Electric Corporation, Tokyo, JP;

Inventors:

Kazuki Setsuda, Tokyo, JP;

Naomichi Chida, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/86 (2006.01); G01N 21/25 (2006.01); G01N 21/3559 (2014.01); G01N 21/31 (2006.01); G01N 33/34 (2006.01); G01N 33/44 (2006.01);
U.S. Cl.
CPC ...
G01N 21/255 (2013.01); G01N 21/3103 (2013.01); G01N 21/3559 (2013.01); G01N 21/86 (2013.01); G01N 33/346 (2013.01); G01N 33/442 (2013.01); G01N 2021/3148 (2013.01); G01N 2021/869 (2013.01); G01N 2021/8636 (2013.01); G01N 2021/8663 (2013.01); G01N 2201/061 (2013.01);
Abstract

A measuring device includes: an irradiator that irradiates electromagnetic waves to an inspection object; a light collector having a reflecting surface that guides, to a light-collecting surface, electromagnetic waves whose incident angle with respect to an incident end facing the inspection object is within a predetermined angle, among the electromagnetic waves that have been transmitted through the inspection object; and a detector that detects the electromagnetic waves guided to the light-collecting surface. The measuring device measures a characteristic of the inspection object based on the detected electromagnetic waves.


Find Patent Forward Citations

Loading…