The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Jan. 03, 2012
Johnathan Charles Sharpe, Hamilton, NZ;
Donald F. Perrault, Jr., Brighton, MA (US);
Blair Morad, Belmont, MA (US);
Johnathan Charles Sharpe, Hamilton, NZ;
Donald F. Perrault, Jr., Brighton, MA (US);
Blair Morad, Belmont, MA (US);
CYTONOME/ST, LLC, Bedford, MA (US);
Abstract
Particle processing systems and methods utilize a sort monitoring system to monitor an operational characteristic for a particle sorting system. The operational characteristic may be related to the performance and operation of a sorter or a group of sorters in the particle sorting system. The operational characteristic may be monitored based on monitoring particles for an output of a sorter or of a group of sorters. Operational characteristics which may be monitored include sort error, sort fraction, yield, purity and recovery percentage. The sort monitoring system may evaluate the monitored operational characteristic, for example, as related to sort performance, and take an action, for example, a corrective action or a notifying action, based on the evaluation of the operational characteristic.