The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Nov. 17, 2017
Applicant:
Samsung Display Co., Ltd., Yongin-si, Gyeonggi-do, KR;
Inventors:
Cheol Min Park, Hwaseong-si, KR;
Jeong Woo Park, Yongin-si, KR;
Seung Kim, Seongnam-si, KR;
Seung Ho Kim, Asan-si, KR;
Hoi Kwan Lee, Suwon-si, KR;
Woo Jin Cho, Yongin-si, KR;
Hee Kyun Shin, Incheon, KR;
Hyun Joon Oh, Seongnam-si, KR;
Assignee:
Samsung Display Co., Ltd., Yongin-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/30 (2006.01); G01N 21/958 (2006.01); G01N 21/91 (2006.01); C03C 15/00 (2006.01); C03C 19/00 (2006.01); C03C 23/00 (2006.01); G02F 1/13 (2006.01); G02F 1/1333 (2006.01); H01L 51/00 (2006.01);
U.S. Cl.
CPC ...
G01N 1/30 (2013.01); G01N 21/91 (2013.01); G01N 21/958 (2013.01); C03C 15/00 (2013.01); C03C 19/00 (2013.01); C03C 23/0055 (2013.01); G02F 1/1303 (2013.01); G02F 1/1309 (2013.01); G02F 1/1333 (2013.01); G02F 2001/133302 (2013.01); H01L 51/0096 (2013.01);
Abstract
A method of detecting defects of a glass substrate includes cutting a glass mother substrate into a plurality of glass substrates, penetrating ions into an incision surface of the glass substrate to visualize defects of the incision surface, and photographing the defects of the incision surface to determine a bending strength of the glass substrate based on a size of the defects.