The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
May. 23, 2017
Fluke Corporation, Everett, WA (US);
J. David Schell, Austin, TX (US);
Seymour Goldstein, Austin, TX (US);
Harlan L. Kassler, Austin, TX (US);
Jackson L. Salling, Austin, TX (US);
Fluke Corporation, Everett, WA (US);
Abstract
An optical testing device is provided. The testing device includes a position sensing detector (PSD) having an optical sensing area that is optically responsive to a first range of wavelengths. The PSD receives a plurality of optical signals having wavelengths within the first range and emitted through a respective plurality of optical fibers and detects a plurality of positions where the optical signals impinged on the optical sensing area for determining array polarity. The PSD receives a plurality of first optical signals having wavelengths within the first range and detects the polarity and a plurality of optical intensities of the first optical signals. The testing device includes a photodetector that is optically responsive to a second range of wavelengths different than the first range. The photodetector receives a plurality of second optical signals within the second range and detects a plurality of optical intensities of the second optical signals.