The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Dec. 27, 2017
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Yao-Long Tsai, Kaohsiung, TW;

Li-Hua Wang, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 3/28 (2006.01);
U.S. Cl.
CPC ...
G01M 3/2807 (2013.01);
Abstract

A method for detecting deterioration of a structural part includes: detecting a waveform of time domain of the structural part by a sensor disposed on the structural part; performing a conversion of time domain to frequency domain for the waveform of time domain by a processor electrically connected to the sensor so as to obtain an actual modal parameter of each of a plurality of modals related to a waveform of frequency domain of the structural part; comparing the actual modal parameter of each of the plurality of modals to modal parameter information stored in a database to determine whether a deterioration defect exists in the structural part; and determining a degree and a position of the deterioration defect when the deterioration defect exists in the structural part.


Find Patent Forward Citations

Tsai, Yao-Long. (2019). Method for detecting deterioration defect of structural part (U.S. Patent No. 10481037). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10481037

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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